OwnerNational Renewable Energy Laboratory (NREL) - view all
Update frequencyunknown
Last updatedabout 1 year ago
Format
OverviewSiCdiodeegsgeothermalhigh temptest
Fabricated SiC diodes are tested in the temperature range of 300 degrees C to 600 degrees C.
Additional Information
KeyValue
dcat_issued2014-08-01T06:00:00Z
dcat_modified2017-08-08T22:12:40Z
dcat_publisher_nameSandia National Laboratories
guidhttps://data.openei.org/submissions/3257
ib1_trust_framework[]
language
Files
- XLSXSiC Diode Test Data.xlsx